http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101157354-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2858 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2008-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2012-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2012-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101157354-B1 |
| titleOfInvention | Electromigration test method for high capacity and high current and circuit for same |
| abstract | The electronic device under test (DUT) may be included in a circuit having a voltage limiter connected in parallel with the DUT. The circuit includes a control current source having an output current connected in series with the DUT. When the output current has a value that will cause the voltage Vdut across the DUT to exceed a certain maximum voltage Vmax if the voltage limiter is not in place, the voltage limiter may provide a voltage limiter with some or all of the output current. By passing through it is characterized in that Vdut is limited to Vmax or less. When the output current has a value such that Vdut is less than or equal to Vmax, no current flows through the voltage limiter. The circuit may include a plurality of DUTs, each DUT connected in series with the output current of the control current source and having a voltage limiter connected in parallel with each DUT. |
| priorityDate | 2008-02-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541 |
Total number of triples: 12.