patent/KR-101127018-B1

Predicate	Object
classificationCPCInventive	http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L13-11 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B3-56 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L47-03 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L21-065 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R35-005
classificationIPCInventive	http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R35-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04M1-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04M3-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R13-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R13-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H04M3-22
filingDate	2005-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate	2012-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate	2012-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber	KR-101127018-B1
titleOfInvention	Measurement method and device
abstract	Provided are methods and apparatus that are adapted to calibrate test probes and oscilloscope systems to substantially eliminate the probe's load impact.n n n n Device under test, inspection system, probe standardization facility, standardized inspection channel, user interface screen
priorityDate	2004-02-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type	http://data.epo.org/linked-data/def/patent/Publication

Predicate	Subject
isDiscussedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23954 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419557109

Total number of triples: 23.