http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101100423-B1

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02G7-12
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
filingDate 2005-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2011-12-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2011-12-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101100423-B1
titleOfInvention Method of forming silicon thin film transistor, gate insulating layer of silicon thin film transistor and manufacturing method of silicon thin film transistor using same
abstract The disclosed silicon thin film transistor includes: a silicon channel formed on a substrate; A gate insulating layer formed on the silicon channel; A gate provided on the gate insulating layer; The gate insulating layer has a structure including an oxide film formed by plasma low temperature oxidation of the silicon channel and an oxide film deposited separately on the channel. The thin film transistor has an improved interface between the gate insulating layer and the channel, and particularly has a low driving voltage.n n n n Polycrystalline, Silicon, Gate Insulation, Plasma Oxidation, Low Temperature Oxidation
priorityDate 2005-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523291
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24261
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457707758
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID977
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419544408

Total number of triples: 17.