http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101059042-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2648 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-265 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N22-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2656 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N22-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-265 |
| filingDate | 2007-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2011-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2011-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-101059042-B1 |
| titleOfInvention | Apparatus and method for detecting electrical properties of excitable materials in a sample |
| abstract | In an apparatus for detecting the electrical properties of a sample of excitable material, in particular a silicon wafer, a microwave source 6 for generating a microwave field, a resonance coupled to the microwave source 6 to transmit microwaves System 2, a resonant system 2 comprising a microwave resonator having at least one aperture and a sample to be inspected arranged adjacent to at least one aperture, arranged around the sample for controlled electrical excitation of the sample At least one excitation source 3, and a measuring device 5 for measuring at least one physical parameter of the resonant system 2. |
| priorityDate | 2006-11-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.