http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101029826-B1
Outgoing Links
Predicate | Object |
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classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2884 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0466 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2863 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
filingDate | 2009-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2011-04-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2011-04-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-101029826-B1 |
titleOfInvention | Silicon contactor and its surface treatment method |
abstract | BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a silicon contactor and a surface treatment method thereof, and more particularly, to a silicon contactor and a surface treatment method thereof capable of suppressing the separation of the conductive powder to prevent loss of the conductivity of the conductive pattern.n n n A silicon contactor for testing a semiconductor device, which is provided between a terminal of a semiconductor element and an inspection circuit board for testing the unsatisfaction of the semiconductor element, and relays an electrical connection between the semiconductor element terminal and the inspection circuit board. A main body including a main body formed by connecting upper and lower portions of the main body and having a conductive pattern including conductive powder, wherein the main body includes at least one of an upper portion and a lower portion of the conductive pattern. And a mesh for preventing separation of the conductive powder forming the conductive pattern.n n n According to the present invention, it is possible to prevent separation of the conductive powder contained in the conductive pattern and abrasion of the conductive pattern so that a good conduction state can be achieved between the terminal and the conductive pattern of the semiconductor element.n n n n Semiconductor, Test, Contactor, Silicon, Printed Circuit Board |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20230081905-A |
priorityDate | 2009-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.