http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100980415-B1
Outgoing Links
Predicate | Object |
---|---|
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-5602 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-40 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-56 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-56008 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C7-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-44 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C7-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-00 |
filingDate | 2008-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2010-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2010-09-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-100980415-B1 |
titleOfInvention | Semiconductor memory device and test circuit for same |
abstract | A test circuit of an open bit line structure semiconductor memory device, which is configured to share a sense amplifier block in response to test data read from a plurality of memory cells included in a cell under test and a compression control signal output from a compression control signal generator. And a compression unit which sequentially compresses test data read from the memory cells and sequentially outputs a compressed test signal.n n n n Open bitline, test |
priorityDate | 2008-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 21.