http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100947322-B1

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0433
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2644
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2008-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2010-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2010-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100947322-B1
titleOfInvention Sample holder of semiconductor type sample measuring device
abstract The present invention relates to a sample holder of a semiconductor type sample measuring apparatus, and an embodiment of the present invention provides a sample holder for measuring characteristics of a semiconductor type sample, the PCB and at least one guide pin fixed perpendicularly to the PCB; One end is coupled to the guide pin and the other end provides a sample holder of the semiconductor type sample measuring apparatus including at least one clip in contact with one side of the sample.n n n n Semiconductor, Sample, Measuring Device, Sample Holder, PCB, Guide Pin, Clip
priorityDate 2008-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419524988
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3468413

Total number of triples: 17.