http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100894035-B1
Outgoing Links
Predicate | Object |
---|---|
classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-30 |
classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0433 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
filingDate | 2007-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate | 2009-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate | 2009-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | KR-100894035-B1 |
titleOfInvention | Micro Multiple Spring Type Semiconductor Device Inspection System |
abstract | The present invention relates to a micro multiple spring type semiconductor device inspection apparatus, and the device inspection apparatus to solve the problem that the signal loss occurs in the connection process and the problem that the contact with the semiconductor device is not made clearly.n n n That is, the present invention is more specifically in the semiconductor device inspection device consisting of a test circuit board and a test socket mounted on the circuit board, three elements having a buffer portion at each different position of the device connection port provided in the test socket It consists of multiple spring element connections made of springs.n n n Therefore, the present invention is composed of a multi-spring element connection port consisting of three springs having buffer portions at different positions, thereby compensating for signal loss due to each buffer portion, and the upper end contacting the semiconductor element forms a contact point with three points, and the signal The delivery is clear.n n n n Device inspection device |
priorityDate | 2007-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.