http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100894035-B1

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-30
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0433
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2007-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2009-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2009-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100894035-B1
titleOfInvention Micro Multiple Spring Type Semiconductor Device Inspection System
abstract The present invention relates to a micro multiple spring type semiconductor device inspection apparatus, and the device inspection apparatus to solve the problem that the signal loss occurs in the connection process and the problem that the contact with the semiconductor device is not made clearly.n n n That is, the present invention is more specifically in the semiconductor device inspection device consisting of a test circuit board and a test socket mounted on the circuit board, three elements having a buffer portion at each different position of the device connection port provided in the test socket It consists of multiple spring element connections made of springs.n n n Therefore, the present invention is composed of a multi-spring element connection port consisting of three springs having buffer portions at different positions, thereby compensating for signal loss due to each buffer portion, and the upper end contacting the semiconductor element forms a contact point with three points, and the signal The delivery is clear.n n n n Device inspection device
priorityDate 2007-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123

Total number of triples: 19.