http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100854455-B1

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B28D5-0076
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-304
filingDate 2006-06-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2008-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2008-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100854455-B1
titleOfInvention Watermark removal method of semiconductor device
abstract In the watermark removing method of the semiconductor device of the present invention, an air molecular contaminant (AMC) adsorbed to a pattern including a silicon rich oxynitride (SRON) film formed on a substrate is cleaned by performing a rapid heat treatment process. Removen n n n SRON membrane, atmospheric molecular pollutant, watermark, heat treatment
priorityDate 2006-06-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 23.