http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100780617-B1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1a492183be65153abfa7dec00d51c816
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02282
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76837
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76
filingDate 2006-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2007-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_683a67b7fd4f447db492fa7697e3ffeb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3bdaf5655b6a3cad6890d1fda5a4dac2
publicationDate 2007-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100780617-B1
titleOfInvention Manufacturing method of semiconductor device
abstract The present invention is to provide a method for manufacturing a semiconductor device that can suppress the generation of voids when manufacturing a field oxide film of the semiconductor device, the present invention to provide a substrate with a trench formed, and the substrate so that the trench is buried A method of manufacturing a semiconductor device, the method comprising: applying an SOG film to an upper portion, and applying a pressure while performing a baking process to homogenize the structure of the SOG film.
priorityDate 2006-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-19980048261-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-19990054301-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419579069

Total number of triples: 19.