http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100678465-B1

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-20
filingDate 2005-02-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2007-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2007-02-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100678465-B1
titleOfInvention Method of forming an optional epitaxial semiconductor layer
abstract A method of forming an optional epitaxial semiconductor layer is provided. The method includes forming a recess in the semiconductor substrate. The semiconductor substrate having the recess is loaded into the reaction chamber. A semiconductor source gas and a main etching gas are injected into the reaction chamber to selectively grow an epitaxial semiconductor layer on inner walls of the recesses. A selective etching gas is injected into the reaction chamber to selectively etch the fence portion of the epitaxial semiconductor layer overgrown on the main surface of the semiconductor substrate adjacent to the sidewall of the recess.n n n n Selective epitaxial, uniaxial strain, planarization, selective etching
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101116336-B1
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