http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100668742-B1

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1a492183be65153abfa7dec00d51c816
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3065
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-12
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2005-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2007-01-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_499bc68359764d9caede29d781f2fb09
publicationDate 2007-01-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100668742-B1
titleOfInvention Threshold measurement method of trench for old recess channel
abstract According to the present invention, a method for measuring a critical dimension of a trench for a sphere-type recessed channel includes forming a trench isolation layer in a first region of a semiconductor substrate having a first region and a second region, and forming a threshold dimension in a second region. Forming a measurement trench that knows the shape, forming a trench for the primary spherical recess channel in the first region, and performing anisotropic etching on the lower portion of the trench for the primary spherical recess channel. Forming a trench for the access channel, wherein the measurement trench is also etched in the horizontal direction by anisotropic etching, and the critical dimension of the measurement trench in which the etching is performed in the horizontal direction is measured, and the measurement trench And determining the threshold of the trench for the secondary spherical recess channel in comparison with the threshold.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10121808-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109087923-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109087923-B
priorityDate 2005-11-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20060062522-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20010008557-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419520437
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID16212546

Total number of triples: 20.