http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100665003-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B9-02044 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01B11-0625 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-25 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-35 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-33 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-3563 |
| filingDate | 2004-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2007-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2007-01-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-100665003-B1 |
| titleOfInvention | Measuring method of organic film thickness on metal surface |
| abstract | The present invention relates to a thickness measuring technique of an organic coating film formed on a metal surface, such as an organic solderability protection (OSP) film, comprising: measuring an absorption spectrum of at least one reference organic coating film formed on a metal surface; Calculating an absorption intensity of a specific wavelength band in an absorption spectrum of the reference organic coating, measuring the thickness of the reference organic coating according to a breakdown measurement method, and based on the absorption strength and the measured thickness of the reference organic coating; Defining a correlation between absorption intensity and film thickness, measuring an absorption spectrum of the organic coating to be formed on the metal surface, and measuring the specific wavelength band in the absorption spectrum of the organic coating to be measured. Calculating the absorption strength and absorbing the organic coating to be measured based on the correlation between the absorption strength and the film thickness. It provides a thickness measuring method of the organic coating film comprising the step of calculating the film thickness from the water strength.n n n n Organic soderability preservative film, IR spectrometry, absorption intensity |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101844071-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101835888-B1 |
| priorityDate | 2004-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.