| abstract |
Applying a first light pulse to the surface 312 of the sample to produce a propagation strain pulse 316, 314 on the sample 315, the second light pulse being a propagation strain pulse in the sample 315. Applying a second light pulse to the surface 312 to interact with 316, 314, sensing a change in the light response of the sample 315 from the reflection of the second light pulse, and the time of occurrence of the change in the light response. A method for characterizing a sample 315 having a structure 310 disposed on or within the sample 315 is disclosed, including associating the at least one dimension with the structure 310. . |