http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100593833-B1

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02W30-20
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09K13-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-46
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C09K13-06
filingDate 2004-05-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2006-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100593833-B1
titleOfInvention Separation and recovery method of ultra-high purity phosphoric acid from semiconductor waste etching solution
abstract The present invention relates to the separation, a method for recovering ultra-high purity phosphoric acid from a semiconductor waste etching solution, and more particularly, to a method for recycling the waste etching solution to be discharged from a semiconductor etching process, the silicon nitride of the silicon wafer film (Si 3 N 4) etch process The present invention relates to a method for separating and recovering ultrahigh purity phosphoric acid, respectively, by performing a film-slip crystallization process without adding an additive or a solvent from the waste etchant.n n n n Semiconductor waste etching solution, phosphoric acid, silicon nitride film,
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100804197-B1
priorityDate 2004-05-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 30.