http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100555544-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L11-042 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L11-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L58-1054 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31924 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-316 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2004-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2006-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2006-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-100555544-B1 |
| titleOfInvention | A device that generates a test stimulus signal with a current source independent of the internal impedance change of the device under test. |
| abstract | An apparatus for generating a test stimulus signal having a current source independent of a change in the internal impedance of the device under test is disclosed. The test stimulus signal generator according to the present invention includes a voltage source generator and a V / I converter. The voltage source generator converts the source data stored in the internal memory into an analog signal, and synthesizes the analog signal and the reference signal of the DC voltage level to generate voltage source test stimulus signals. The V / I converter converts the voltage source test stimulus signals into current source test stimulus signals and outputs them to the input pins of the device under test. The V / I converter maintains the current of the current source test stimulus signals at the set value regardless of the change in the internal impedance value present at the input pins of the device under test. The test stimulus signal generator according to the present invention has an advantage of accurately testing the operating performance of the device under test by generating a test stimulus signal having a current source irrespective of the internal impedance change of the device under test. |
| priorityDate | 2004-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID54891 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449577181 |
Total number of triples: 19.