http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100541729-B1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2877 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate | 2003-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2006-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2006-01-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-100541729-B1 |
| titleOfInvention | Semiconductor device inspection device |
| abstract | The present invention relates to a semiconductor device inspection apparatus that can minimize the defect rate of the semiconductor device generated by the temperature conditions by testing the durability against the temperature of the semiconductor device.n n n The semiconductor device inspection apparatus according to the present invention includes a match plate 20; A contact module 50 coupled to the match plate 20 and having a heat dissipation unit 30 contacting the semiconductor element 70 and a test unit 40 for crimping the lead 72 of the semiconductor element 70. and; It is attached on the contact surface of the heat dissipation unit 30 of the contact module 50 in contact with the semiconductor element 70, the thermoelectric conducting heat generated from the semiconductor element 70 to the heat dissipation unit 30 of the contact module 50. The conductive pad 60 is comprised. Accordingly, the reliability of the durability test with respect to the temperature of the semiconductor device can be further improved.n n n n Match Plate, Heat Dissipation Unit, Test Unit, Contact Module, Thermally Conductive Pad, Semiconductor Device |
| priorityDate | 2003-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268 |
Total number of triples: 15.