http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100445757-B1

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09G1-02
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C09K3-14
filingDate 2001-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2004-08-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2004-08-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100445757-B1
titleOfInvention Slurry For Polishing Metal Lines
abstract BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing slurry composition used in a chemical mechanical polishing / planarization (CMP) process for the purpose of planarization of wafers in the manufacture of semiconductor devices, and more particularly, to fine metal oxide powders, silver compounds, and poly ( Acrylic acid), nitric acid, ammonia water and deionized water comprising a slurry composition for polishing the metal wire, using the polishing slurry composition of the present invention, it is possible to compensate the problems of erosion and dishing occurs during polishing.
priorityDate 2001-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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