| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-5004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-5002 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50016
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786 |
| filingDate |
1996-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
1999-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8fa8a8cde2192e27660d9fc000eaaf45 |
| publicationDate |
1999-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
KR-100201167-B1 |
| titleOfInvention |
TF's Reliability Evaluation Method |
| abstract |
The time coefficient β, the voltage coefficient d, and the temperature coefficient Φ 0 were experimentally determined by a -BT stress test on a jumbo TFT including a plurality of TFTs manufactured in the same condition and connected in parallel to each other. The mean value μ and the standard deviation σ of the threshold voltage shift amount are obtained by the -BT stress test.n n n n n n n n The lifetime of each TFT is evaluated using the equation. |
| priorityDate |
1995-04-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |