http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100197044-B1

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filingDate 1992-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 1999-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9bba9205a636cd10ae269a84100a0b4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8b310bf05eb2279a070a8d4e3be16990
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publicationDate 1999-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100197044-B1
titleOfInvention Epoxy Resin Compositions and Semiconductor Devices
abstract This invention uses together the epoxy resin containing a naphthalene ring, and the epoxy resin containing a biphenyl group, and simultaneously uses the phenol resin of following formulan n n n n n n n (Wherein R 3 is Or a group in which some or all of the hydrogen atoms of these groups are substituted with alkyl groups having 1 to 5 carbon atoms, R 4 is a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, r is an integer of 0-5.) And (D) inorganic The present invention relates to an epoxy resin composition having a filler as an essential component.n n n The epoxy resin composition is a combination of the above-described components, and has good fluidity and low modulus of elasticity, particularly at a temperature higher than the glass transition, significantly lowers the modulus of elasticity, has a low linear expansion coefficient, and has a low stress and glass transition temperature. And a low hygroscopic hardened | cured material is obtained, and the semiconductor device enclosed with the hardened | cured material of the said epoxy resin composition has high reliability also in the thermal shock at the time of surface mounting.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20030057107-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100502533-B1
priorityDate 1991-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 39.