http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-0161610-B1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_47cc435e1d443f13180f7766df104d9d http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_adea3e1035b6bfdecd1d543d93bdb1e8 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07378 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1995-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 1999-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_14016e83e544ed225bcef738b98435c2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c0af03d828426bd453eef8db45238ac9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9a1ca038efa17b82c6c954fc698750f9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4d5c9eae906d7a7832582652f4dfb3e0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1074fc4ac3d98096b817ec67c846bcfa http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c5ecd918847553ff238e06ae51c9ae35 |
| publicationDate | 1999-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | KR-0161610-B1 |
| titleOfInvention | Jig for semiconductor characteristic measurement, manufacturing method thereof and use method thereof |
| abstract | [OBJECT] To provide a measuring jig for a semiconductor device that is economical and has excellent exchange efficiency, a manufacturing method thereof, and a method of using the same.n n n [Configuration] A circuit board 1, an intermediate board 2, and a circuit board 3, wherein the circuit board 1 comprises a connection terminal group 11 and a circuit board 3 to a measuring instrument or a power supply. Consisting of a group of wiring conductors 12 for electrically connecting the group of connecting terminals 13 and the respective terminal groups 11 and 13, wherein the circuit board 3 is a terminal group of the circuit board 1 Connection terminal group 33 to a connection terminal group 31 to the circuit board 1 and at least a semiconductor device mounted on the circuit board 3 or a socket for connecting the semiconductor device to a location corresponding to (13). And a wiring conductor group 32 for electrically connecting the respective terminal groups 31 and 33, and the intermediate plate 2 corresponds to the terminal group 13 and the terminal group 31, respectively. Insulation plate having a plurality of holes 21 in which the inner wall is metallized, jig having a pin 22 insulated from the inner wall of the plurality of holes 21 and having elasticity, and a circuit board (1) and the circuit A plate 3 is made, a hole 21 is drilled in a position corresponding to the terminal group 13 and the terminal group 31, and an intermediate plate 2 in which the inner wall is metallized is made, and a circuit board ( The plurality of pins 22 are fixed to the terminal group 13 of 1), and the circuit board 1 is disposed so that the pins 22 having a plurality of elasticities do not contact the holes 21 in the intermediate plate 2. By using the manufacturing method and the jig, the circuit board 1 and the intermediate plate 2 are prepared one by one, prepared according to the type of semiconductor device for measuring the circuit board 3, and the measurement circuit Alternatively, a method of measuring two or more kinds of semiconductor devices by replacing a circuit board 3 while a power supply circuit or the like is connected to the circuit board 1. |
| priorityDate | 1994-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549582 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID8301 |
Total number of triples: 24.