http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2016121700-A1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E10-549 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P70-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C07F7-22 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10K30-80 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C01G19-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C01G19-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C01G19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L51-44 |
| filingDate | 2016-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2017-11-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-WO2016121700-A1 |
| titleOfInvention | Tin (II) halide perovskite thin film and method for producing the same, and electronic device and photoelectric conversion apparatus using the same |
| abstract | In the X-ray diffraction chart, the tin halide (II) -based perovskite compound of the present invention has a diffraction angle 2θ of 10 ° to 50 ° with respect to the diffraction peak of the plane index (002) corresponding to the tin (II) halide-based perovskite compound. The intensity ratio of the diffraction peak with the highest intensity corresponding to the tin (IV) compound existing in the range of 0 ° or less is 10% or less. |
| priorityDate | 2015-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 49.