http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S62280661-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_38520f366e74704305b34fb93a81121e |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-22 |
| filingDate | 1986-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5c950a6f84b7f0cdc3d41f8e295d59cb |
| publicationDate | 1987-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-S62280661-A |
| titleOfInvention | Integrated circuit with direct current characteristic testing circuit for logical output buffer |
| abstract | PURPOSE: To eliminate the need for a test pattern and to shorten the time required for a DC characteristic test by providing an exclusive OR gate between the output of the integrated circuit and an output buffer and applying a logical value from a test terminal. n CONSTITUTION: Input terminals 2aW2n of the integrated circuit 4 are grounded and logical inputs are all 0; and then a test switch 9 is operated while outputs 4a and 4m, etc., of the circuit 4 are 0 and 1, etc., to obtain 0 as the logical value of the test terminal 9, and consequently outputs of exclusive OR gates E 1 and Em are 0 and 1 respectively, so that 0 and 1 are outputted to output terminals 3a and 3m, etc., of the circuit 1 through output buffers B 1 and Bm. Further, when 1 is obtained as the logical value of the terminal 5, on the other hand, 1 and 0 are outputted from terminals 3a and 3m respectively. Further, even when the terminals 2W2n are fixed at logic 1, the DC characteristics of logical output buffers are tested speedily similarly without using any test pattern. n COPYRIGHT: (C)1987,JPO&Japio |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007017231-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4591241-B2 |
| priorityDate | 1986-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID516892 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453034310 |
Total number of triples: 19.