http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S62176135-A

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filingDate 1986-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cfacd89a93a340538f6675fee34fdd14
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publicationDate 1987-08-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S62176135-A
titleOfInvention Etching method for resin film
abstract PURPOSE: To form an opening pattern having a specified shape for a minute through hole highly accurately, by providing a mask on an organic macromolecular resin film, which has insulating property and a thermal expan sion coefficient of 3×10 -5 /k or less, and performing wet etching. n CONSTITUTION: As an insulating material between wirings for an integrated circuit mounting wiring substrate, it is desirable to use an organic macromolecular resin, which has a thermal expansion coefficient of 3×10 -5 /k and a low dielectric constant and is suitable for high-speed propagation of an electric signal. It is suitable to use a polyimide resin, which is especially excellent in heat resistance. In order to utilize the effect of the present invention sufficiently, it is most desirable to use new polyimide, whose thermal expansion coefficient is small in comparison with a conventional polyimide resin (thermal expansion coefficient is 4×10 -5 k or more). As a basic chemical structure of such a low thermal-expansion-coefficient polyimide, a material comprising a formula (I) is listed. In etching the low thermal-expansion-coefficient resin film, the film is immersed in hydrazine etching liquid at a half curing treatment stage at a heating temperature of 205°C, at which imide is not completely formed. n COPYRIGHT: (C)1987,JPO&Japio
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105017529-A
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priorityDate 1986-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.