http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S61154137-A

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
filingDate 1984-12-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f371171a3dd05e08653fd984a9715723
publicationDate 1986-07-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S61154137-A
titleOfInvention Test probe assembly
abstract PURPOSE:To enable a multiplicity of probes to be arranged easily without causing positional deviation of the tip ends of the probes, by providing a plurality of transparent plates of a non-conductive material between the probes so that probes are allowed thereby to slide a little in the axial direction while they are inhibited from moving in the transverse direction and pinned down at the position of the holes provided in the transparent plates and that the non-conductive transparent plates serve as separators. CONSTITUTION:Probes 4 are set by means of a plurality of transparent plates 6 which are formed of a non-conductive material and provided in apertures 2 of a base 1. The transparent plates 6 are thin plates of quartz or epoxy material for example and are provided with as many holes 7 as the probes to be mounted there. The holes 7 of each transparent plate are aligned with the holes of the other plates so that the probe is passed through the holes of the other plates so that the probe is passed through the holes 7 thus aligned. The hole 7 has a diameter slightly larger than that of the probe 4 so that each probe 4 is mounted slidably in the holes 7. The proves 4 are connected to a contact terminal with an external unit, namely to a lead-out section 12 by a wire 8 of copper or the like to which the probes 4 are welded.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S63262850-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H01276073-A
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Total number of triples: 21.