http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S5988660-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_460c2d3884b7724541bf93de2a201dfd
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-67
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 1982-11-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0e250fa6289eb29869a64415b527ac67
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e541844d4e8811b79239468b02092d9
publicationDate 1984-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S5988660-A
titleOfInvention Ic wiring tester
abstract PURPOSE:To prevent the destruction of an IC terminal caused by faulty connection and erroneous manipulation in checking continuity, by lowering voltage between the terminals of a tester used in checking the wiring of an MOS integrated circuit. CONSTITUTION:The parallel diode circuit of an inter-terminal voltage generation part 20 is constituted from a silicon diode of which voltage drop is 0.7V in a sequential direction and voltage of 0.35V is applied to a diode D2. Low constant- voltages each of 0.35V are induced at both ends of test terminals 22a, 22b. Even if the input terminal 63 of a logical circuit 60 constituting IC 1 is earthed by error wiring and the connection wiring 61 between the test terminals 22a, 22b is brought to a disconnection state, the voltage between the test terminal is 0.35V and lower than the breakdown voltage of IC and, therefore, the logical circuit 60 is not destructed.
priorityDate 1982-11-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123

Total number of triples: 15.