http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S59203971-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be055db3c1a09879df07379ba969e223 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1983-05-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e98041cb402cd7b7701193f68e1eb09a |
| publicationDate | 1984-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-S59203971-A |
| titleOfInvention | Inspecting device of lsi |
| abstract | PURPOSE: To measure automatically an inspection time by integrating counted values of the inspection time. n CONSTITUTION: When the stage for a prober is elevated and an aluminum vat is brought into contact with a measuring stylus; a high-level start signal is generated and the output of an FF3 is inverted to a low level. Then, a gate 4 is activated and a counter 6 counts a clock from a reference clock generator 5. Its counting is carried on until the stop signal goes up to a high level to transfer the counted value to an accumulator 7, and a high-level stop signal passed through a delay circuit 8 resets the counter 6. Then, the accumulator 7 integrates the inspection time to measure automatically the inspection time of an LSI. n COPYRIGHT: (C)1984,JPO&Japio |
| priorityDate | 1983-05-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419491804 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5359268 |
Total number of triples: 12.