http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S5443481-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_44f82521bd7b49adba4be2e3e4f3b66a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1977-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e2646a75a222a19553c699152707e130
publicationDate 1979-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S5443481-A
titleOfInvention Screening method for semiconductor device
abstract PURPOSE: To select the defect through measurement of the reverse current when the balance is kept between the temperature on the element surface and the peripheral temperature by leaving the airtight-sealed semiconductor device into the lowtemperature atomsphere of 0W5°C. n CONSTITUTION: The airtight-sealed device is left more than 5 hours at a high temperature of 100°C or more to vaporize the micro amount or water within the container, and then the inside of the airtight container is kept under 0W °C. At the same time, the dry air of under dew point-30°C is flown. When the temperature on the element surface is balanced with the peripheral temperature, the reverse voltage is applied to the pn-junction to measure the reverse current. If the humidity within the container is high, the internal relative humidity becomes more than 100% as the room temperature lowers down. As a result, the dew condensation is given to increase the reverse current suddenly. In this way, the screening removal is given to obtain high-reliability device. n COPYRIGHT: (C)1979,JPO&Japio
priorityDate 1977-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635

Total number of triples: 13.