http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S5254381-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1975-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_532a514f3af68c37e14f1a7dad9fc8a9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f4b4be4765fbbb3f00c4def092f75e3 |
| publicationDate | 1977-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-S5254381-A |
| titleOfInvention | Method of testing moisture resistance of semiconductor device |
| abstract | PURPOSE: To increase the accelaration coefficient as an acceleration test and make possible the testing under defective product producing effect resembling to actual service condition by making the test by placing a semiconductor device to be tested in water vapor of high temperature and high pressure and applying voltage between the electrodes of the semiconductor device. n COPYRIGHT: (C)1977,JPO&Japio |
| priorityDate | 1975-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962 |
Total number of triples: 13.