http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H118384-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-088
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28
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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 1997-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1e8457fbfcebfc88965d50342f2ca93a
publicationDate 1999-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H118384-A
titleOfInvention Semiconductor device manufacturing method
abstract (57) Abstract: When forming a compensation diffusion layer on a semiconductor substrate exposed through a connection hole opening, aggregation of metal silicide occurs, It is an object of the present invention to avoid a problem that a resistance value increases and to enable high integration of a high-speed semiconductor device using a low-resistance metal silicide such as titanium silicide. When a compensation diffusion layer is formed on a semiconductor substrate exposed by a connection hole opening, impurities are implanted by ion implantation at a background pressure of 1.3 × 10 −7 Pa or less after the connection hole opening etching. A method of manufacturing a semiconductor device in which a compensation diffusion layer is formed by performing a heat treatment at 600 ° C. or less, or by performing silicon epitaxial growth at a background pressure of 1.3 × 10 −7 Pa or less and a temperature of 600 ° C. or less. .
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010109379-A
priorityDate 1997-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 31.