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filingDate 1997-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2919b18599416b1b6de57bc96b33f340
publicationDate 1999-02-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H1138041-A
titleOfInvention Cantilever type probe needle for probe card, its manufacturing method and control method
abstract PROBLEM TO BE SOLVED: To provide a probe needle for a probe card, a method for manufacturing the same, and a method for controlling the same, which can prevent a decrease in the reliability of a semiconductor device due to an inspection process. SOLUTION: In a cantilever type probe needle for a probe card, a tip part 1 of the probe needle is connected to a first convex part 3a. And a second convex portion 3b formed with the first convex portion 3a and the groove portion 4 therebetween.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012067161-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012112680-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015537213-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20130102081-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012067162-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012112681-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009503535-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9625492-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014145772-A
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Total number of triples: 27.