http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11343110-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5547f741b25666fc4ae5195cf71a979b
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C14-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-203
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C01B33-02
filingDate 1998-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_142d21ea716930bd196a5dae9af5e924
publicationDate 1999-12-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H11343110-A
titleOfInvention Preparation method of clathrate compound thin film
abstract (57) [Problem] To provide a method of forming a clathrate compound thin film having a uniform film thickness with good film thickness controllability. An alkali metal deposited film is formed on a substrate made of a group IV element such as silicon and germanium, and an amorphous semiconductor film made of the same material as the material forming the substrate is formed thereon. Next, the substrate is subjected to a heat treatment in a rare gas atmosphere and then to a heat treatment in a vacuum.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007246326-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6797199-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013018679-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6461581-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012224488-A
priorityDate 1998-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.