patent/JP-H11326280-A

Predicate	Object
assignee	http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d78fe473c8a29219129bbc8bb50f6a59
classificationIPCInventive	http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-62
filingDate	1998-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor	http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f708c45b7e4ad8d27a4fe1460904c168 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2bad7157f348d49c4c005b4e2afdbe0c
publicationDate	1999-11-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber	JP-H11326280-A
titleOfInvention	Trace metal analysis method
abstract	PROBLEM TO BE SOLVED: To provide a method for analyzing trace metals, which eliminates the influence of interfering ions particularly related to fluorine during analysis and enables very sensitive analysis of trace metals. SOLUTION: In a trace metal analysis method for analyzing a trace metal present in a liquid containing a fluorine species by an inductively coupled plasma mass spectrometer, the mass resolution of the mass spectrometer is set to 2000 to 3500. Analysis method for trace metals.
isCitedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8616077-B2
priorityDate	1998-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type	http://data.epo.org/linked-data/def/patent/Publication

Predicate	Subject
isDiscussedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453708627 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID962 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457280313 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID14917 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID8154 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419512635 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559562

Total number of triples: 20.