http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11326246-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6bfdf49224a405be1f7b653c56ebad94 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 |
| filingDate | 1998-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2b33c09c38833cffac387b40cad4f173 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3a2be554a682b0011f06b81bf1e4651b |
| publicationDate | 1999-11-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H11326246-A |
| titleOfInvention | Method for measuring the abundance ratio of constituent elements in inorganic ion exchangers |
| abstract | (57) [Summary] [Problem] To measure the component element abundance ratio in an inorganic ion exchanger, it is possible to measure the component element abundance ratio in an inorganic ion exchanger more accurately than the conventional method. In addition, the present invention provides a method for quickly, simply and accurately measuring the constituent element abundance ratio without interference even when a large amount of coexisting inorganic ion elements is present. A method of measuring the abundance ratio of constituent elements in an inorganic ion exchanger is characterized by measuring constituent elements of the inorganic ion exchanger using an X-ray fluorescence spectrometer. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017058362-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010506176-A |
| priorityDate | 1998-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 35.