http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11202029-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5547f741b25666fc4ae5195cf71a979b |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318572 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C7-06 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate | 1998-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fb905a989074fcb499fda62ef7bacb51 |
| publicationDate | 1999-07-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H11202029-A |
| titleOfInvention | Input buffer circuit of semiconductor integrated circuit |
| abstract | [PROBLEMS] To provide an input buffer circuit of a semiconductor integrated circuit capable of realizing a test pattern having a high failure detection rate in a state where leakage current is cut off during an IDDQ test. SOLUTION: When a test enable signal TIB is at "L" level, an enable terminal IT of a differential circuit 2 is set to "H". A level signal is input, and in this case, the differential circuit 2 operates as a normal differential circuit. At this time, the terminal B of the input switching circuit 3 is selected, and the output signal Q of the differential circuit 2 is output as the output signal OUT. Next, when performing the IDDQ test, the test enable signal TIB is set to the “H” level. Thereby, the enable terminal I of the differential circuit 2 “L” level is input to T, and the through current of the differential circuit 2 is cut off. Also, the terminal A of the input switching circuit 3 Is selected, and the input signal IN is output as the output signal OUT. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8760205-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7629810-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009201183-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013518285-A |
| priorityDate | 1998-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419515296 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID135529435 |
Total number of triples: 23.