http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11176817-A

Outgoing Links

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3065
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filingDate 1998-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cd31d90728fc0affa3f1bcaf278842c6
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publicationDate 1999-07-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H11176817-A
titleOfInvention Polysilicon etching method and its etching apparatus
abstract PROBLEM TO BE SOLVED: To provide a polysilicon etching method and an etching apparatus capable of performing isotropic etching without generating plasma. The method includes the steps of: loading a wafer having a polysilicon film formed on a specific film into a process chamber; adjusting pressure and temperature conditions of the process chamber within a set range; Supplying an etching gas into the process chamber 18 to etch the polysilicon film. Therefore, the polysilicon film can be easily etched using an etching gas such as a halogen compound gas and a NF 3 gas having a low binding energy.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005531479-A
priorityDate 1997-12-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 23.