http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H1114566-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-207
filingDate 1997-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f5e6c210cb839d95444f41ce916e642
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bd27f7fc092911650d4f4831948b35bb
publicationDate 1999-01-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H1114566-A
titleOfInvention X-ray apparatus for X-ray diffraction measurement and X-ray fluorescence measurement
abstract (57) [Summary] [PROBLEMS] To provide an X-ray apparatus for performing both X-ray diffraction measurement and X-ray fluorescence measurement by improving the arrangement of an X-ray detector for X-ray fluorescence measurement. Improve measurement accuracy of measurement. An X-ray source that emits X-rays, an X-ray counter that detects X-rays diffracted by a sample, an SSD that detects fluorescent X-rays generated from the sample, and a sample axis ω A θ rotation driving system 9 for rotating the sample 8 by θ with respect to the X-ray source 1 and an X-ray counter 6 around the sample axis ω. Rotation drive system 11 for rotating the .theta. An X-ray apparatus comprising: The SSD 23 is moved so as to approach or move away from the sample 8 in conjunction with the θ rotation between the X-ray source 1 and the sample 8 and the 2θ rotation between the X-ray source 1 and the X-ray counter 6. Thus, the SSD 23 is moved forward and backward with respect to the X-ray optical system.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103728244-A
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priorityDate 1997-06-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.