http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H11145227-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_bb009cce0f8e0a13a2e6d9675616c640
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 1997-11-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_368f4b690b3e0bb306157b8e29b0a19d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3ed52585504ea1ba31d960506e17bbf3
publicationDate 1999-05-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H11145227-A
titleOfInvention Temperature control equipment for semiconductor wafer test equipment
abstract (57) [Summary] A wafer temperature control plate capable of maintaining a semiconductor wafer at a uniform temperature with high accuracy in a burn-in test is disclosed. A temperature-adjusting plate for uniformly maintaining a predetermined temperature while energizing a wafer, comprising: a thermally conductive disk; The cooling fluid flow path 6 in which the flow path expands as the cooling fluid flows from the central part toward the peripheral part, and an electric heating line in which the heat generating wires are arranged so that the peripheral part is dense and the central part is sparse. A wafer temperature adjusting plate comprising a heater 7, temperature sensors 5a to 5c, and a temperature controller C, wherein the temperature of a central portion is set to be low and the peripheral portion is set to be high according to a temperature difference of a wafer.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7554350-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008128839-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009123555-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100745032-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005510044-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7397258-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101296817-B1
priorityDate 1997-11-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419573697
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9397

Total number of triples: 21.