http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H10315255-A
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1374dd16777534b65ad4422333245af8 |
classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29L7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29K69-00 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08J7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29C41-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29C41-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-30 |
filingDate | 1997-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f46c9962d4f9747fbbb5387aceb7a174 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b84d81bb4025bc0aa5820b3993cbfb77 |
publicationDate | 1998-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-H10315255-A |
titleOfInvention | Film manufacturing method and apparatus |
abstract | (57) [Problem] To provide a method for easily eliminating various defects generated in a film when the film is manufactured. SOLUTION: An image of a defect of a film is obtained by transmitting or reflecting light by projecting a light beam from an oblique direction to a film surface, and the image is processed and analyzed to determine the cause and / or degree of the defect. Then, from these, the film production conditions to be changed are determined, and this is fed back to the film production apparatus to control the film production conditions. |
priorityDate | 1997-05-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 36.