http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H10253552-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5198a2a21392d6cbc0bb4898b3fb3d29 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 |
| filingDate | 1997-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_55d56d25357f016281df5843fb84de15 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_102d02095c78580925c3f2ee7342c417 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_67c67c877ee411a254d66f685685c632 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_549bab29a8afe46ec2b81a360af1838c |
| publicationDate | 1998-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-H10253552-A |
| titleOfInvention | Crystal defect analysis method for single crystal sample and sample holder |
| abstract | (57) [Summary] [Problem] Even when the diameter of an opening of a sample holder and the diameter of a single crystal sample are close to each other, no scattered X-rays are generated and an accurate X An object of the present invention is to provide a method for analyzing a crystal defect of a single crystal sample and a sample holder capable of obtaining a line topograph. SOLUTION: By performing an X-ray topographic analysis method using a sample holder made of a material whose intensity of scattered X-rays is less than the sensitivity of an X-ray film, there is no scattering image generated in a conventional sample holder. And the efficiency of the measurement operation was significantly improved by eliminating the X-ray topograph re-measurement operation. |
| priorityDate | 1997-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.