http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H10197500-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_74973199515dbabd2310245aab03e282
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filingDate 1997-01-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a71647421d73ebdf924e0660d5e3d30b
publicationDate 1998-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H10197500-A
titleOfInvention Inspection signal recording device
abstract (57) [Summary] [PROBLEMS] To make it possible to shorten the entire inspection time by setting the moving speed of a sensor in an inspection to be twice or more as compared with the conventional one, and to set the measurement pitch in the turning direction more finely. A scanning jig (2) including a sensor (3) as an object to be inspected (1). And the sensor 3 is spirally moved by a signal from the scanning jig driving device 4. The scanning jig driving device 4 transmits the sensor position to the position monitoring device 5 and moves the sensor 3 so as to make two rotations with respect to the scanning pitch in the axial direction. In the first rotation, the position monitoring device 5 outputs a measurement trigger signal to the inspection and measurement device 11 to drive the sensor 3. The test and measurement device 11 outputs the obtained test signal and trigger signal to the A / D converter 8, converts the test signal into a digital signal, and records the digital signal in the buffer memory 9. In the next rotation of the sensor 3, The buffer memory 9 is stored in the recording device 1 by the mode switching device 7. The inspection signal for one rotation recorded in the buffer memory 9 is recorded in the recording device 10.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011106949-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9383343-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013083560-A
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Total number of triples: 20.