http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H10148615-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b10513547be1f75566f36bfd0ab16965 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-03 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-443 |
filingDate | 1996-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1928ae7fcfd88bb565dd170cb61fd0de http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_057677e5f026726a401a656731542a26 |
publicationDate | 1998-06-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-H10148615-A |
titleOfInvention | Wavelength inspection method for spectrofluorometer and cell thereof |
abstract | (57) [Problem] To provide a wavelength inspection method for a spectrofluorometer that can easily inspect the accuracy of the wavelength of a monochromator. An inspection cell includes a filter that selectively absorbs light having the same wavelength as an inspection wavelength, and a reflector that obtains outgoing light to a fluorescent-side monochromator from a direction substantially orthogonal to incident light from an excitation-side monochromator. In the inspection wavelength setting step (s10) of setting the fluorescence-side monochromator to zero order, and a light-receiving amount comparison step of detecting the wavelength of the excitation-side monochromator at which the absorbance detected by the detector is maximized ( s16), an error calculating step (s18) of calculating an error between the detected wavelength of the excitation-side monochromator and the inspection wavelength, and, if the error calculation value is smaller than a predetermined allowable value, the wavelength accuracy of the excitation-side monochromator is reduced. Judge as no abnormality, A determining step (s20) of determining that there is an abnormality when the wavelength is larger than the allowable value, and a wavelength inspection method for a fluorescence spectrophotometer. |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012047562-A |
priorityDate | 1996-11-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
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isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419583173 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23988 |
Total number of triples: 18.