http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H10132829-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-60
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filingDate 1996-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9c1f74b50145a7f1cfd91a387ba1bfb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_05a324d13730120b61ecc64a8f876de6
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publicationDate 1998-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H10132829-A
titleOfInvention Measurement method using scanning probe microscope
abstract PROBLEM TO BE SOLVED: To provide a method for measuring a sample surface in a liquid using a scanning probe microscope having STM and AFM functions, and to measure a sample surface with high sensitivity while exciting a cantilever. Provide a possible measurement method. SOLUTION: The scanning probe microscope used in the measuring method of the present invention includes a cantilever having a conductive probe 3, and performs scanning while scanning the surface of a sample placed in a liquid with the probe 3. The cantilever is covered with an insulator except for the probe tip 4 and the electrode. The cantilever is excited at the resonance frequency, and while the current or amplitude flowing between the probe and the sample is controlled so as to be in a predetermined state, the other is monitored.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008500555-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6776031-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007147347-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2013525760-A
priorityDate 1996-10-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.