| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_069a92549123806a5d654dc036a676e9 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-17 |
| filingDate |
1995-09-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d0bad0660a19828de3c4ae3ef0186d00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_107d41e6d4ba832955de52228236bda0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f2aca63e11eff8ff72a0705b65c7aa7b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8535d1b430b6514dfb977a0d4f3657fa |
| publicationDate |
1997-04-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-H0989759-A |
| titleOfInvention |
Optical waveguide sensor and measuring method |
| abstract |
(57) Abstract: [PROBLEMS] To provide an optical waveguide sensor capable of highly sensitive measurement of a refractive index without a moving part. A substrate (11), an optical waveguide (12) formed on the surface of the substrate (11) made of a high refractive index thin film material, and a guided light loss means (13) formed on the surface of the optical waveguide (12). Also, the substrate 11 and the first substrate formed on the surface of the substrate 11. And the second waveguide 12A formed of a thin film material having a high refractive index and formed on the waveguide. Furthermore, Another thin film coating layer 15 is formed on the second waveguide 12A. Equipped with. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009119796-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007537439-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4782777-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-5388309-B2 |
| priorityDate |
1995-09-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |