http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0936485-A

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Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2c8578e2265835db1117e94480d6e97c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_38520f366e74704305b34fb93a81121e
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01S5-026
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01S5-00
filingDate 1995-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_721ceff8bbeec7ae1d26293544066941
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_695a2edafe3d9673e13ba3921cfda228
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a79a40885fa37b8b6c4c1949aec39c78
publicationDate 1997-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H0936485-A
titleOfInvention Method for joining cleavage planes of semiconductor substrate and integrated semiconductor optical device
abstract (57) [Abstract] [Objective] To provide a novel method for continuously forming different crystal layers in the lateral direction. [Structure] A p-type Al x Ga 1-x As (x = 0.5) first cladding layer 1 is formed on a semi-insulating GaAs base substrate 10. 2, p-type GaAs-type active layer 14, p-type Al x Ga 1-x A s (x = 0.5) second cladding layer 16 and p-type Ga The first semiconductor substrate 110 is formed by sequentially crystallizing the As contact layer 18. On the semi-insulating GaAs base substrate 20, n-type Al x Ga 1-x As (x = 0.5) First cladding layer 22, n-type GaAs active layer 24, n-type A l x Ga 1-x As (x = 0.5) second cladding layer 26, Then, the n-type GaAs contact layer 28 is sequentially crystal-grown to form the second semiconductor substrate 120. Thereafter, the first cleaved surface 110b formed by cleaving the first semiconductor substrate and the second cleaved surface 1 formed by cleaving the second semiconductor substrate 120. 20b and 20b are brought into close contact with each other on the flat plate 30, and in that state, the cleaved first and second semiconductor substrates 110a and 120a are heat-treated at 400 ° C. in a hydrogen atmosphere for about 1 hour.
priorityDate 1995-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID89859
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419522218

Total number of triples: 17.