http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H09232398-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8242
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filingDate 1996-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cc8d4a3d5de8bf409457f0143fb6fbf1
publicationDate 1997-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H09232398-A
titleOfInvention Ferroelectric film evaluation apparatus and method
abstract (57) [Summary]nPROBLEM TO BE SOLVED: To easily and rapidly perform polarization deterioration test of a ferroelectric film. And the deterioration characteristics of the ferroelectric film can be estimated. A ferroelectric film evaluation apparatus and method thereof are realized.nSOLUTION: Input terminal T 1 , T Two Control signal applied to By transfer gate TG 1 The conduction state, TG Two The non-conduction Set to the state and measurement terminal T Three Apply a constant voltage to An odd number of inverters connected in series and in a ring on a conductor board Generated by the ring oscillator ROSC configured as The generated pulse signal is buffer BUF, transfer gate TG 1 Through the node ND at a predetermined time Two Strong connected to Dielectric capacitor C 1 Control signal after applying to the electrodes of By transfer gate TG 1 To the non-conducting state, transfer gate TG Two To the conductive state, and the ferroelectric capacitor C 1 Stop applying the pulse signal to the measurement terminal T Three And out Force terminal T OUT Through the ferroelectric capacitor C 1 Characteristics of Is measured.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2004112248-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6466039-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6114861-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103412210-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7078978-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-0101161-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103412210-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100444316-B1
priorityDate 1996-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 27.