http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0888251-A
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate | 1994-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7d4ec17b407de9296a8902311a654e96 |
publicationDate | 1996-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-H0888251-A |
titleOfInvention | Semiconductor test equipment |
abstract | (57) [Abstract] [Purpose] Regarding the handler for the LSI tester, to prevent the defective LSI after the test from being treated as a non-defective. [Structure] An LSI having trays 22, 23, 24 in which an untested product storage unit 2, a non-tested product storage unit 3, and a defective product storage unit 4 are respectively removable, and tray guides 12, 13, 14 for positioning them. In the tester handler, the tray 22 for untested products and the tray 23 for good products have rectangular contours, and the tray for defective products The chamfered portion 24a is provided by cutting off one of the four corners of the rectangle diagonally, and the defective product storage tray guide 14 is a guide piece 14 for guiding the chamfered portion 24a. shall include a. The defective product tray 24 can be easily identified, and no tray other than the defective product tray 24 can be mounted in the defective product storage section 4. |
priorityDate | 1994-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Predicate | Subject |
---|---|
isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453067793 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID44152565 |
Total number of triples: 14.