http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0888251-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 1994-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7d4ec17b407de9296a8902311a654e96
publicationDate 1996-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H0888251-A
titleOfInvention Semiconductor test equipment
abstract (57) [Abstract] [Purpose] Regarding the handler for the LSI tester, to prevent the defective LSI after the test from being treated as a non-defective. [Structure] An LSI having trays 22, 23, 24 in which an untested product storage unit 2, a non-tested product storage unit 3, and a defective product storage unit 4 are respectively removable, and tray guides 12, 13, 14 for positioning them. In the tester handler, the tray 22 for untested products and the tray 23 for good products have rectangular contours, and the tray for defective products The chamfered portion 24a is provided by cutting off one of the four corners of the rectangle diagonally, and the defective product storage tray guide 14 is a guide piece 14 for guiding the chamfered portion 24a. shall include a. The defective product tray 24 can be easily identified, and no tray other than the defective product tray 24 can be mounted in the defective product storage section 4.
priorityDate 1994-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID453067793
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID44152565

Total number of triples: 14.