http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08292239-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-00
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filingDate 1995-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8d2b4beac223954fe3a0244dfd2e1b7b
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publicationDate 1996-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08292239-A
titleOfInvention Accelerated life test method and test equipment for electronic equipment
abstract (57) [Summary] [Purpose] To provide an accelerated life test method and test equipment assuming actual use by users. [Arrangement] An accelerated life test method comprising a step of adhering oil smoke 35 and dust 13 to a TV sample 37, a temperature change cycle acceleration test step, a humidity change cycle acceleration test step, and a dielectric strength test step. Test equipment.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102288845-A
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102184292-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010249679-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106604022-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113901675-A
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priorityDate 1995-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 29.