http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08292232-A

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filingDate 1996-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49263200b6199c386138ee1d6f623787
publicationDate 1996-11-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08292232-A
titleOfInvention Wedge probe
abstract (57) Abstract: A row of tapered wedges having an insulator and first and second conductors fixed to both sides of the insulator by an adhesive is provided in an inter-foot gap of an integrated circuit device. In a wedge probe for inserting and pressing to electrically connect the test device to the foot of the integrated circuit through the conductor, the wedge probe A wedge probe with a device that facilitates good contact between the connector and the foot of the IC. According to one embodiment of the present invention, each of the tapered wedges extends toward the tip thereof from the insulator and the first and second wedges. A wedge probe is provided having an adhesive free gap with at least one of the second electrical conductors. According to the present invention, it is possible to prevent an inadvertent short circuit due to solder or the like between two individual conductors on the tapered wedge.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012022815-A
priorityDate 1995-02-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.