http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08264612-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5198a2a21392d6cbc0bb4898b3fb3d29
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-108
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-956
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8242
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 1995-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_de7458a5656e9efd1c92e8bda440223b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7a1a5284e33c3fc2e807d9ac5e7de4a
publicationDate 1996-10-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08264612-A
titleOfInvention Silicon wafer evaluation method
abstract (57) [Summary] [Object] To provide a method for simply and non-destructively evaluating a pn junction reverse bias leak current due to a decrease in information charge retention time of DRAM and a charge retention time defect rate of DRAM. [Structure] There is a correlation between the defect density measured by infrared interferometry and the pn junction leakage current amount, and the leakage current amount of an unknown silicon wafer is estimated by examining the correlation in advance. In addition, the defect rate of the charge retention time of the DRAM is similarly obtained by using the infrared interference method to obtain the correlation with the defect density, so that the defect rate can be estimated nondestructively without waiting for the end of the in-line process. To do.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107764832-A
priorityDate 1995-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123

Total number of triples: 19.